U.S. patent number 3,992,111 [Application Number 05/545,468] was granted by the patent office on 1976-11-16 for apparatus for detecting defect locations at the surface of a moving reflecting material.
This patent grant is currently assigned to Ciba-Geigy AG. Invention is credited to Walter Kamber, Alfred Roulier.
| United States Patent |
3,992,111 |
| Roulier , et al. |
November 16, 1976 |
Apparatus for detecting defect locations at the surface of a moving
reflecting material
Abstract
Apparatus for detecting defect locations at the surface of a
moving reflecting material comprising a light source and a first
optical system which directs the light thereof successively upon
surface regions of the material situated along a line extending
essentially transversely to the direction of movement of the
material. A photoelectric transducer and a second optical system
are provided, the second optical system collecting the light
reflected from the individual surface regions at the transducer. An
indicator device or mechanism which as a function of the intensity
of the light reflected by each surface region produces a signal,
especially an optical signal, which is associated with the relevant
surface region. According to the invention the light source is a
laser light source, the first optical system splits up the laser
beam into an essentially two-dimensional parallel bundle of rays,
the plane of which intersects the surface of the material to be
examined approximately perpendicularly and which grazingly impinges
upon the material surface, especially at an angle less than
5.degree., and that in the path of the rays of the light impinging
upon the material there is arranged a movable diaphragm which
periodically only frees individual partial regions of the planar
bundle of rays.
|
Inventors: |
Roulier; Alfred (Neuenegg,
CH), Kamber; Walter (Marly, CH) |
|
Assignee: |
Ciba-Geigy AG (Basel,
CH)
|
| Family
ID: |
5906403 |
| Appl.
No.: |
05/545,468 |
| Filed: |
January 30, 1975 |
Foreign Application Priority Data
| Current U.S.
Class: |
356/431; 359/235;
250/559.48; 250/559.02 |
| Current CPC
Class: |
G01N
21/8901 (20130101) |
| Current International
Class: |
G01N
21/89 (20060101); G01N 21/88 (20060101); G01N
021/32 () |
| Field of
Search: |
;356/200,199,209,211,188
;350/273,274 ;250/571,572 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
|
|
|
|
|
|
|
666,513 |
|
Oct 1938 |
|
DT |
|
880,135 |
|
Oct 1961 |
|
UK |
|
Primary Examiner: Corbin; John K.
Assistant Examiner: Rosenberger; Richard A.
Attorney, Agent or Firm: Falber; Harry Jorda; Karl F.
Claims
What is claimed is:
1. An apparatus for detecting defect locations at the surface of a
moved reflecting material, comprising a light source, a first
optical system which directs the light emanating from said light
source successively at surface regions of the material located
along a line extending essentially transversely with respect to the
direction of movement of the material, a photoelectric transducer
and a second optical system which collects the light reflected from
individual surface regions of the material at the transducer, an
indicator device which as a function of the intensity of the light
reflected from each surface region generates a signal corresponding
to the relevant surface region, the improvement comprising said
light source consisting of a laser light source, said first optical
system splitting up the laser beam into an essentially
two-dimensional parallel bundle of light rays, the plane of which
approximately perpendicularly intersects the surface of the
material to be inspected and which two-dimensional parallel bundle
of light rays grazingly impinges upon the material surface at a
predetermined angle of incidence, and a movable diaphragm arranged
in the path of the light rays impinging upon the material, said
diaphragm periodically only freeing individual partial regions of
the planar bundle of light rays.
2. The apparatus as defined in claim 1, wherein the signal which is
generated is an optical signal.
3. The apparatus as defined in claim 1, wherein said predetermined
angle is smaller than 5.degree..
4. The apparatus as defined in claim 3, further including a
non-transparent obstacle arranged in the path of light rays between
the second optical system and the photoelectric transducer in such
a manner that the light rays reflected at the predetermined angle
of incidence are collected at the obstacle and light rays reflected
at an angle different than the predetermined angle of incidence are
deflected past the obstacle and collected at the photoelectric
transducer, and wherein the indicator device only then generates a
signal when the photoelectric transducer has been illuminated by
the light rays deflected past the obstacle.
5. The apparatus as defined in claim 1, wherein the indicator
device controls a number of signal generators each of which is
operatively associated with a certain position of the
diaphragm.
6. The apparatus as defined in claim 5, wherein the signals
generated by the indicator device last approximately for the
duration of the period of the diaphragm movement.
7. The apparatus as defined in claim 1, wherein the movable
diaphragm consists of a disk which is rotatable about an axis
arranged essentially parallel to the direction of the light rays
and externally thereof, said disk possessing a series of
substantially arcuate-shaped slots of the same central angle but
different radii.
8. The apparatus as defined in claim 1, wherein the movable
diaphragm possesses a slot, and means for continuously moving said
slot to-and-fro parallel to the plane of the bundle of light rays
but transversely to the direction of the rays.
9. The apparatus as defined in claim 1, wherein the wavelength of
the laser light is in the longwave visible range of the
spectrum.
10. The apparatus as defined in claim 1, wherein the wavelength of
the laser light is in the near infrared range.
Description
BACKGROUND OF THE INVENTION
The present invention relates to a new and improved apparatus for
detecting flaws or defect locations at the surface of a moved
reflecting material.
The apparatus of this development is of the type embodying a light
source and a first optical system which directs the light thereof
successively upon a surface region of the material located along a
line extending essentially transversely with respect to the
direction of movement of the material. There is also provided a
photoelectric transducer and a second optical system which collects
the light reflected from the individual surface regions at the
transducer, and an indicator device which as a function of the
intensity of the light reflected by each surface region generates a
signal, especially an optical signal, which is associated with the
relevant surface region. Equipment of this type is particularly
employed for the surface control during the fabrication of
photographic materials, such as films, paper, etc.
With known apparatuses of this type there is illuminated, through
the agency of a movable optical system, in succession partial zones
or regions of the material web to be examined
(flying-spot-technique), and imaged via a second optical system at
a stationary light detector. These prior art apparatuses are
relatively complicated and require large optical components which
extend over the entire width of the material web and past the same.
Since such large optical components are difficult to fabricate and
thus expensive the state-of-the-art apparatuses are only suitable
for relatively small material web widths.
SUMMARY OF THE INVENTION
Hence, it is a primary object of the present invention to provide
an improved construction of apparatus for detecting defect
locations at the specular surface of a moving material in a manner
not associated with the aforementioned drawbacks and limitations of
the state-of-the-art proposals.
Another and more specific object of the invention aims at the
provision of an apparatus of the previously mentioned type which is
relatively simple in construction and also suitable for use with
material webs of relatively large width.
Now in order to implement these and still further objects of the
invention which will become more readily apparent as the
description proceeds, the invention contemplates that the light
source is a laser light source, that the first optical system
splits or divides the laser beam into an essentially
two-dimensional parallel bundle or beam of rays, the plane of which
approximately perpendicularly intersects the surface of the
material which is to be examined and which beam of rays grazingly
impinges upon the material surface, especially at an angle which is
less than 5.degree.. Further, in the path of the rays of the light
impinging upon the material there is arranged a movable diaphragm
which periodically only frees individual partial regions of the
planar bundle of light rays.
BRIEF DESCRIPTION OF THE DRAWINGS
The invention will be better understood and objects other than
those set forth above, will become apparent when consideration is
given to the following detailed description thereof. Such
description makes reference to the annexed drawings wherein:
FIG. 1 is a schematic illustration of the apparatus of this
development;
FIG. 2 is a view on an enlarged scale taken along the line II--II
of FIG. 1; and
FIG. 3 is a view corresponding to the showing of FIG. 2, but
illustrating a variation of a detail thereof.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
Describing now the drawings it is to be understood that only enough
of the apparatus structure of this development has been shown in
order to preserve clarity in illustration and to provide a detailed
understanding of the basic and underlying concepts of the
invention. Referring therefore more particularly to FIG. 1, a
parallel bundle of light rays 2, emanating from a laser light
source 1, is fanned out into an essentially two-dimensional
parallel bundle of light rays 4 by means of a system of cylindrical
lenses 3' and 3". The plane of the parallel bundle of light rays 4
is located in the plane of the drawing. The wavelength of the laser
light can be in the longwave visible range of the spectrum or in
the shortwave infrared range. The thickness of the parallel bundle
of light rays perpendicular to its plane amounts to only a few
millimeters. The parallel bundle of light rays 4 grazingly impinges
at a very flat angle .alpha. upon the reflecting or specular
surface of a material web 5 which is to be examined or inspected,
for instance a web of a photographic film, and at that location is
reflected at the same angle. The angle of incidence .alpha.
preferably amounts to less than 5.degree.. It is to be understood
however that in the drawings it has been illustrated to be
considerably larger in order to improve the recognizability
thereof. The width of the parallel bundle of light rays is
dimensioned such that the same, for a given angle of incidence
.alpha., scans the entire width of the material web, as such has
been indicated in FIG. 1 by the broken lines. The material web 5
which is to be examined can be forwardly advanced in its lengthwise
direction via rollers 6 and in a direction which is perpendicular
to the plane of the drawing.
In the path of the light rays impinging upon the material web
surface there is located a movable diaphragm or light stop 7 which
is in the form of a substantially circular disk rotatable about its
axis 7a by means of any suitable and therefore not particularly
illustrated drive motor. The diaphragm disk 7 has been shown on an
enlarged scale in FIG. 2. It possesses a series of arcuate-shaped
slots 7b, all of which are concentrically arranged with respect to
the axis of the disk and possess the same central angle, i.e. angle
at the center of the disk. Their spacing from the disk axis and
thus their radii are however different. The rotational axis 7a of
the diaphragm disk 7 is located in the plane of the parallel bundle
of light rays 4 parallel to the light rays, however externally
thereof. The diameter of the disk is dimensioned such that the same
can interrupt the bundle of light rays over its entire width. The
position of the bundle of light rays 4 with respect to the
diaphragm disk 7 has been indicated in FIG. 2 in phantom lines.
Depending upon the rotational position of the disk 7, by means of
the slots 7b thereof only a narrow partial region or portion 8 of
the bundle of light rays 4 is freed, which periodically travels
transverse to the direction of spreading or fanning out of the rays
and thus in each instance only illuminates a small surface region
of the material web which travels periodically to-and-fro
transversely with respect to the material web-lengthwise direction.
With the illustrated exemplary embodiment the material web 5 is
divided into eight such regions corresponding to the number of
slots in the diaphragm. Of course, there would be possible a
coarser or finer subdivision.
The light 9 reflected by the specular surface of the material web 5
is collected by means of a further optical element or lens 3'" at a
non-transparent barrier or obstacle 10. Behind this obstacle 10
there is arranged a photoelectric transducer 11, for instance a
phototransistor or the like. Now when the surface of the material
web to be examined does not possess any defect locations, then all
the light is collected at the obstacle or hinderance 10 and the
transducer 11 is not illuminated. On the other hand, in the case of
a defect location at the material surface the light rays are
reflected at an angle other than .alpha. and therefore no longer
impinge upon the barrier or obstacle 10, rather are diverted
therepast and arrive at the photoelectric transducer 11, as such
has been indicated by the phantom-line illustrated light ray 9'.
Hence, the photoelectric transducer 11 only then delivers an
electrical signal when there is illuminated a defect or flaw
location at the surface of the material. This signal is delivered
through the agency of an amplifier 12 to an indicator device 13
which possesses a number of control lamps 13a corresponding to the
number of slots in the diaphragm disk 7. It will be understood
therefore that each control lamp is operatively associated with a
certain surface region of the web width.
The diaphragm disk 7 is provided at its outer or marginal edge with
holes or apertures 7c which together with a light barrier
consisting of a lamp 14 and a photocell 15 controls via an
amplifier 16 a system, generally indicated by reference character
13b, contained in the indicator device 13 for determining the
rotational position of the diaphragm disk 7. In the indicator
device 13 there are correlated the signals emanating from the
transducer 11 and the system for detecting the rotational position,
that is to say, a signal of the transducer 11 which indicates a
defect location is correlated or associated with the momentary
rotational position of the diaphragm disk 7 and therefore the
location of the defect in a certain surface region on the material
web. In the presence of a defect location there is illuminated the
corresponding signal lamp 13a associated with each such region. In
this way it is possible in a very simple manner to pin-point or
localize surface flaws or defects.
Preferably the indicator device 13 is constructed such that the
duration of illumination of the signal lamps 13a, upon the presence
of a defect location, is just as long as the period or time of the
diaphragm movement. In this case it is possible to easily detect
especially defects which are not of point-like configuration,
rather extend in the lengthwise direction of the material, in that
the relevant signal lamp continuously lights-up.
In FIG. 3 there is illustrated a different possibility for
interrupting the parallel bundle of light rays 4. A strip 17 formed
of non-transparent material and located in the path of the rays is
mounted to be displaceable parallel to the plane of the rays and
perpendicular to the rays. It possesses a transparent slot 17a. The
drive of the strip 17 occurs through the agency of an eccentric
disk 17b which in turn is driven by a not particularly illustrated
motor. The eccentricity of the disk and thus the stroke of the
strip 17 are calculated such that the slot 17a periodically
migrates to-and-fro from one to the other edge of the bundle or
beam of light rays. With this arrangement the surface of the
material web is continuously impinged or scanned. With suitable
electrical construction of the indicator device it is however
possible to divide the entire width of the material web into
individual partial regions and to again associate therewith a
respective signal lamp.
An apparatus of the previously described type was used for
controlling the freshly poured layer of a lithographic film having
a web width of 110 centimeters. As the light source there was used
a He-Ne-laser of 1mW output power, the rays of which were fanned
out by the cylindrical lens system into a parallel bundle of rays
of a cross-section of 4 .times. 40 mm.sup.2. The angle of incidence
of the laser beam at the film surface amounted to 3.degree.. There
was used a circular disk diaphragm of the type shown in FIG. 2 and
having eight slots. The disk was driven by a synchronous motor at
50 revolutions per second. The indicator device embodied eight
signal lamps which were arranged over the corresponding regions
over the film web.
The inventive apparatus for the detection of errors has two
considerable advantages. Firstly, it only requires relatively small
optical components and with the exception of the moved diaphragm
possesses no mechanically moved components. Due to the foregoing it
is constructionally extremely simple and functionally reliable.
Such factors and the small size of the optical components --simple
lenses of conventional diameter-- are extremely favorable from the
standpoint of the fabrication costs of the apparatus.
Although the inventive apparatus under consideration has been
described as a matter of convenience in conjunction with the
checking and control of photographic materials, it is to be of
course understood that the apparatus is also suitable for
determining surface defects or flaws of other reflecting material
webs, for instance metal-, glass- or plastic plates and foils,
trickle films flowing over supports, free-falling liquid curtains
or liquid films produced by extrusion. Similarly, also the
combination of a laser light source with a cylindrical optical
system and a movable diaphragm is not only very advantageous for
the detection of surface defect locations, rather generally for
scanning purposes of all types.
While there is shown and described present preferred embodiments of
the invention, it is to be distinctly understood that the invention
is not limited thereto, but may be otherwise variously embodied and
practiced within the scope of the following claims.
ACCORDINGLY,
* * * * *