U.S. patent number 3,646,371 [Application Number 04/845,001] was granted by the patent office on 1972-02-29 for integrated timer with nonvolatile memory.
This patent grant is currently assigned to The United States of America as represented by the Secretary of the Army. Invention is credited to Friedrich W. Flad.
| United States Patent |
3,646,371 |
| Flad |
February 29, 1972 |
INTEGRATED TIMER WITH NONVOLATILE MEMORY
Abstract
A remote settable electronic circuit timer system is described
using an integrated MOS counter supplemented by an integrated
programmable decoder consisting of MNOS transistors. Charge storage
in the dielectric of the MNOS transistors is used to achieve memory
without power. The setting information is counted into the counter
at an accelerated rate and then transferred into the decoder, which
serves as a memory. At the start of the timing operation, the
counter is reset to zero. Then the counter counts up and when
coincidence with the number stored in the decoder is achieved, an
output signal is generated. The system automatically adjusts the
setting for deviations of the oscillator frequency from its nominal
value. Also, during the setting operation, all circuits of the
timer are checked for proper functioning.
|
Inventors: |
Flad; Friedrich W. (Rockville,
MD) |
|
Assignee: |
The United States of America as
represented by the Secretary of the Army (N/A)
|
| Family
ID: |
25294163 |
| Appl.
No.: |
04/845,001 |
| Filed: |
July 25, 1969 |
| Current U.S.
Class: |
327/279; 102/215;
377/39; 377/52; 377/121; 968/846 |
| Current CPC
Class: |
H03K
5/135 (20130101); G04F 10/04 (20130101) |
| Current International
Class: |
H03K
5/135 (20060101); G04F 10/04 (20060101); G04F
10/00 (20060101); H03k 017/28 (); F42c
011/06 () |
| Field of
Search: |
;307/221,223,224,238,279,293
;328/37,43,48,49,50,51,72-75,119,129-131 ;102/7.2R |
References Cited
[Referenced By]
U.S. Patent Documents
Other References
Pub. I "Electronics Review" in Electronics, Vol. 41 No. 22, dated
Oct. 28, 968, pages 49-50..
|
Primary Examiner: Miller, Jr.; Stanley D.
Claims
What is claimed and desired to be secured by United States Letters
Patent is:
1. A digital timer for fuzes and the like comprising a main counter
and a decoder both formed from semiconductor integrated circuits,
said decoder including means for storing a count when power is
removed, means coupled to said main counter for inserting a count
into it, means coupling said counter and decoder for transferring
said count to said decoder and responsive to a coincidence in the
count in said counter and decoder for producing an output signal
indicative of said coincidence, an oscillator, and means including
a scaler formed from semiconductor integrated circuits coupling the
output of said oscillator to said main counter, said means coupling
the output of said oscillator to said main counter including means
for bypassing said scaler.
2. A timer according to claim 1 wherein said scaler and main
counter both comprise a plurality of MOS transistor flip-flops and
said decoder comprises a plurality of MNOS transistor
flip-flops.
3. A timer according to claim 2 including a setback and spin
activated power supply coupled to said scaler, counter and decoder.
Description
The present invention relates to a simplified and inexpensive timer
which utilizes integrated circuitry. The timer can be set and reset
an unlimited number of times and after setting it remembers the
time setting without power being applied. During setting, the
oscillator of the timer is calibrated and all circuits are checked
for proper operation.
The timer of the present invention is constructed for use in time
fuzes of artillery rounds. The fuze power supply is spin and
setback activated. This means that no power is available to the
timer prior to firing. For the setting operation, power is supplied
by a setting box. After setting, the fuze is disconnected from the
setting box. This requires that the timer memory maintain its
information without the application of power. To meet this
requirement, the timer of the present invention employs a memory
incorporating elements in the form of p-channel insulated gate
field-effect transistors with silicon nitride as gate insulator and
a thin silicon dioxide layer between the silicon surface and the
nitride layer, hereafter referred to as MNOS transistors. These
devices are capable of storage without power and are compatible
with the integrated circuitry techniques used in manufacturing the
more conventional MOS transistors.
Various timers have been proposed in the past but none has been
found suited for use in time fuzes of artillery rounds. Timers
utilizing magnetic core counters have the capability of memory
without power but, because of their large size and bulk and their
high cost of manufacture, they are not suited to fuze applications.
Timers with fusible links as memory elements can be produced by
integrated circuit techniques but have only a limited number of
resets because the burning out of the fuze links is not reversible.
Finally, timers with ferroelectric memories need polarization
voltages of about 200 v. or more and thus require complicated and
expensive interface between memory elements and counter.
The present invention avoids these and other difficulties by
providing a small, lightweight, and inexpensive fuze timer which
can be manufactured using more or less conventional integrated
circuit techniques. The timer comprises integrated MOS counters
supplemented by an integrated programmable decoder consisting of
MNOS transistors. Charge storage in the dielectric of the MNOS
transistors is used to achieve memory without power.
The setting information is counted into the counter of the present
invention at an accelerated rate and then transferred into the
decoder which serves as a memory. At the start of the timing
operation, the counter is reset to zero. Then the counter counts up
and when coincidence with the number stored in the decoder is
achieved, an output signal is generated. The system automatically
adjusts the setting for deviations of the oscillator frequency from
its nominal value. Also, during the setting operation, all circuits
of the timer are checked for proper functioning.
It is therefore one object of the present invention to provide an
integrated circuit timer with a nonvolatile memory.
Another object of the present invention is to provide a remote
resettable electronic timer.
Another object of the present invention is to provide an electronic
timer utilizing integrated MOS counters supplemented by an
integrated programmable decoder consisting of MNOS transistors.
Another object of the present invention is to provide a spin and
setback activated timer particularly adapted for use in the time
fuzes of artillery rounds.
Another object of the present invention is to provide a timing
system which automatically adjusts the setting of the system for
deviations of the oscillator frequency from its nominal value.
These and further objects and advantages of the invention will be
more apparent upon reference to the following specification,
claims, and appended drawings, wherein:
FIG. 1 is an overall block diagram of the resettable timer of the
present invention;
FIG. 2A is a diagram of an MNOS transistor with the gate connected
to the source electrode of the transistor;
FIG. 2B is a plot of the drain current as a function of the drain
voltage with zero gate bias showing the on state and the off state
of the transistor;
FIG. 3A is a diagram of an MNOS transistor with the gate connected
to the drain electrode of the transistor;
FIG. 3B is a plot of drain current as a function of drain voltage
for the MNOS transistor connection shown in FIG. 3A;
FIG. 4 is a detailed circuit diagram of the programmable decoder
forming a part of the timer of FIG. 1, showing an integrated
circuit construction of MNOS transistors;
FIG. 5 is a plot of waveforms appearing in FIG. 1 during timer
setting;
FIG. 6 is a similar plot of waveforms during later stages of the
setting sequence;
FIG. 7 is a plot of voltage waveforms for FIG. 1 during the
sequence of scaler checking; and
FIG. 8 is a plot of voltage waveforms for FIG. 1 for the timer
setting check.
The digital timer of the present invention comprises a time base
and an accumulator. In the preferred embodiment, the accumulator
takes the form of a digital counter. This counter is advanced one
count after each period of the time base. If at time t.sub.o =0 the
state of the counter was 0, the state of the counter at time
t.sub.l represents the elapsed time between t.sub.o and t.sub.l in
units of time base periods. At time t.sub.l the timer produces an
output signal which initiates a function such as activating a fuze
firing circuit. This is achieved by a decoder in the timer which
produces an output signal when the counter reaches the state which
corresponds to t.sub.l. Alternatively, the timer may produce an
output signal when the counter reaches its maximum corresponding to
t.sub.max. In order to obtain the output signal at t.sub.l and not
at t.sub.max, the counter must start at t.sub.o =0 from a state
corresponding to the time complement t.sub.max -t.sub.l.
The time delay t.sub.l is variable and is programmed electrically
by a setting box, requiring not more than four connections between
the setting box and timer. The maximum number of connections
eliminates the possibility of providing for parallel setting of the
decoder or parallel resetting of the counter. In the present
invention, the decoder is programmed by counting the number of
pulses corresponding to t.sub.l into the counter and then
transferring this number into the decoder in parallel. The decoder
serves as memory and stores the information. Before the timing
operation starts, the counter is reset to zero. During the timing
operation, the counter counts up and when coincidence with the
number stored in the decoder is achieved, an output signal is
generated.
In the case of a preset counter, a number of pulses corresponding
to the time complement t.sub.max -t.sub.l is counted into the
counter. The counter itself serves as a memory. In the timing
operation, the count is continued until the maximum count is
reached. Then an output signal is generated.
FIG. 1 shows a preferred embodiment for the timer of the present
invention in which the count is first inserted into a counter and
then transferred to a decoder which serves as a memory. Referring
to FIG. 1, the timer, generally indicated at 10, comprises a scaler
12, a main counter 14, and a programmable decoder 16. In addition
to the ground terminal 18, the timer 10 includes a memory set and
control line terminal 20, a memory reset and feedback line terminal
22, and a setter power terminal 24. Setter power is applied to
scaler 12 through a gate 26 and automatic reset device 28 to the 10
stages of scaler 12 which take the form of integrated circuit
flip-flops, preferably formed by insulated gate field-effect
transistors or MOS transistors. Main counter 14 is made up of 12
flip-flop stages, again preferably formed from integrated MOS
transistors. Programmable decoder 16 consists of 11 flip-flop
stages using integrated MNOS transistors in addition to an input or
pulse separation circuit 30 and an output circuit 32. The various
elements of the timer are interconnected by a plurality of gates
labeled G.sub.1 -G.sub.14, as illustrated. A setback and spin
activated fuze power supply is illustrated at 34 and the timer
includes a fuze oscillator 36, preferably operating at a frequency
of about 5,120 Hz. Finally, an output signal from the timer is
developed from the decoder 16 on lead 38 which is supplied to a
fuze firing circuit (not shown).
The memory elements of the timer are virtually p-channel insulated
gate field-effect transistors with silicon nitride as gate
insulator and a thin silicon dioxide layer between the silicon
surface and the nitride layer. In their original state, these
devices perform very similar to MOS transistors. However, if a
positive voltage with respect to the substrate is applied to the
gate of a magnitude that produces a field in the oxide layer in
excess of a critical value of approximately 10.sup.6 v./cm.,
electrons can tunnel through the oxide. They are trapped in the
nitride near the oxide-nitride interface. If the positive voltage
is removed, these trapped charges produce a negative "built-in"
voltage in the dielectric, which decreases the threshold voltage of
the device. The threshold voltage can virtually be made zero. The
charges remain stored in the dielectric for a very long time
without power being applied. Within the operating range of the
timer, the effect is almost independent of temperature. If a
negative voltage in excess of the critical value is applied to the
gate, the process is reversed and the device is changed back to its
original state. The critical voltage is well defined. If the supply
voltage is chosen below the critical voltage, the device can be
operated as a field-effect transistor without changing its
threshold voltage.
FIGS. 2 and 3 illustrate the operation of such a device. FIG. 2A
shows an MNOS transistor with the MNOS transistor 40 having a drain
electrode 42, a source electrode 44, and a gate 46. In FIG. 2A, the
gate is shown as connected to the source. FIG. 2B is a plot of
drain voltage i.sub.D as a function of drain voltage V.sub.D with a
zero gate voltage. Curve 48 in FIG. 2B shows the characteristic of
the transistor in the on state whereas curve 50 shows the
characteristic with the transistor in the off state, i.e., a
straight horizontal line. The horizontal divisions in FIG. 2B
represent 1 v. per division whereas the vertical divisions are each
indicative of a change in current of 0.2 ma.
FIG. 3A shows a similar MNOS transistor 52 having a drain 54,
source 56, and gate 58. In FIG. 3A, the gate 58 is connected to
drain 54. FIG. 3B is a similar plot of drain current i.sub.D as a
function of drain voltage V.sub.D for the transistor connection
shown in FIG. 3A. Curve 60 is a plot of the transistor
characteristic when the transistor is turned on and curve 62 is a
similar plot with the transistor turned off. As before, the
horizontal divisions each represent a change in voltage of 1 v. and
the vertical divisions a current change of 0.2 ma.
FIG. 4 is a detailed circuit diagram of the programmable decoder 16
of FIG. 1. The decoder uses MNOS transistors as memory elements
which act as insulated gate field-effect transistors with an
electrically alterable threshold voltage. If a negative signal of
about 45 v. with respect to the substrate is applied to the gate,
the device is turned "off." This means the device has a threshold
greater than 0 v. If a positive signal of about 45 v. with respect
to the substrate is applied to the gate, the device is turned "on."
This means its threshold voltage is 0 v. Hence, the transistor is
conducting with no bias applied to the gate. A logical "0" is
represented by a potential of approximately +25 v. and a logical
"1" is represented by a potential close to ground. In FIG. 4, the
four resistors 64, 66, 68, and 70 at the left-hand side of the
circuit diagram, are discrete components. The remainder of the
circuit in FIG. 4 is formed from integrated components. Dashed line
boxes 72, 74, and 76 show three different N-regions used as
substrates which regions are electrically isolated from each other.
All of the active elements in the circuit of FIG. 4 are of the MNOS
type. Those elements which actually perform a switching function
are referred to as transistors, with the letter Q and appropriate
subscript. Elements which only serve as a load resistor are
identified as resistors with the letter R and appropriate
subscript. All diodes shown connect with their cathode to the
N-substrate. It is possible to implement them by diffusing
P-regions into the N-substrate in the same stem with the source and
drain region of the other elements.
FUNCTIONAL DESCRIPTION
Following is a functional description illustrating the manner of
operation of the circuit structure described above, particularly in
reference to the overall timer of FIG. 1.
The time base can be thought as an oscillator. The timer must be
settable in increments of 0.1 second. This determines the time base
period to 0.1 second. An oscillator of this frequency requires
rather large frequency determining components. In order to obtain
better stability and to be able to use thick film techniques in
manufacturing the oscillator, it is advantageous to choose a higher
oscillator frequency. To obtain the required 0.1 second time base
period, the oscillator frequency is divided by the MOS counter or
scaler 12. So an oscillator frequency of 5,120 Hz. was selected.
This frequency is divided by a nine-stage binary counter in the
scaler.
The maximum number of connections to the setting box allows only
serial setting of the timer. To obtain a short setting time, the
timer has to be set at an accelerated rate. This is accomplished by
bypassing the scaler and feeding the oscillator output signal
directly into the counter 14. Using the fuze oscillator rather than
an external pulse source to set the timer, makes it possible to
compensate for deviations of the oscillator from its nominal
frequency. The oscillator signal is fed to the counter through a
gate. Opening and closing of the gate is controlled by an external
precision timer. If the timer is to be set to t.sub.x and the
dividing factor of the scaler is N, the opening time of the gate
t.sub.o is
t.sub.o =t.sub.x /N
The period of the fuze oscillator is T.sub.o +.DELTA.T, where
T.sub.o is the nominal period. The number of periods n counted by
the counter during t.sub.o is
n= t.sub.o /T.sub.o +.DELTA.T (2)
In timing operation with the scaler in the circuit a time base
period is N(T.sub.o +.DELTA.T) and the counter counts n periods
until an output signal occurs. This gives a delay time t.sub.D,
t.sub.D =n(T.sub.o +.DELTA.T)N
or with (2) to =t.sub.o /T.sub.o +.DELTA.T (T.sub.o +.DELTA.T)N
or with (1) t.sub.D =t.sub.x
This is independent of the oscillator period. Since the counter can
count only integer numbers, equation (2) contains an error. This
error is a fraction of a period .alpha.(T.sub.o +.DELTA.T), where
.alpha.<1. In timing operation, this error is multiplied by N,
but since the delay time also is multiplied by N, the relative
error stays the same and depends only on the resolution of the
counter.
In the setting procedure, only the oscillator 36 in the fuze is
used as a time base. To be sure that the counter sees the correct
time base frequency during timing operation, it is necessary to
check the scaler for proper operation. As described previously, the
setting information is first counted into the counter before it is
transferred into the decoder 16. Therefore, the counter has to be
checked for proper operation prior to this. These considerations
led to the following sequence:
Step 1: Main counter is checked for correct reset and proper
operation.
Step 2: Setting information is counted into main counter.
Step 3: Information is transferred from counter into decoder.
Step 4: Scaler is checked for proper reset and operation.
Step 5: Counter is checked for proper setting.
Thus, a "ready" signal after the setting sequence insures not only
that the time has been set to the correct value, but also that all
circuits are in operational condition.
The fuze power supply is spin and setback activated. Therefore, it
is only in operation when the fuze is fired. For setting and
checking operations, power is supplied externally by the setter.
The firing circuit works only from the fuze power supply.
Therefore, the timer can be driven through the firing point without
setting off the detonator.
The fuze oscillator 36 provides a time base. A unique feature of
the system is that the fuze oscillator requires no trimming,
because in the setting sequence the fuze oscillator timer is
calibrated against a precision oscillator in the setter. The scaler
12 is a binary counter consisting of 10 flip-flops. Its purpose is
to divide the frequency of the fuze oscillator. Only the first nine
stages of the scaler are used as a frequency divider, providing an
output signal with a period of 100 msec, if the fuze oscillator is
at its standard frequency. The 2.sup.9 flip-flop of the scaler is
used as a control flip-flop.
The main counter 14 consists of 12 flip-flops arranged to form a
binary counter. Only the first 11 flip-flops are used for counting,
providing a count capability of 2047. The 2.sup.11 flip-flop of the
main counter is used as a control flip-flop. The programmable
decoder 16 contains a memory element for each of the flip-flops
2.sup.0 through 2.sup.10 of the main counter and is a simplified
decoder, which compares the state of the main counter with the
number stored in the memory. The memory elements are MNOS
transistors. They are in the "on" state if they represent a "0" and
in the "off" state if they represent a "1." A memory reset pulse
switches all memory elements to the "on" state, that means to "0."
If a memory set pulse is applied, all memory elements whose
corresponding flip-flops in the main counter are in the "1" state
are switched to the "off" state. The remaining memory elements
remain unaltered in the "0" state. This means that the state of the
main counter 14 is duplicated in the memory of decoder 16. The
decoder compares each bit in the memory with its corresponding
flip-flop of the main counter. If a flip-flop represents a number
which is equal to or greater than the corresponding memory bit, the
gate associated with this bit gives an output. The output circuit
of the decoder gives a low output signal on lead 38 if there is an
output signal from each individual bit gate. This means if a low
output signal from the decoder occurs, the number represented by
the state of the main counter is equal to or greater than the
number stored in the memory. If the main counter counts up starting
from 0, the first output signal from the decoder occurs when the
number represented by the state of the main counter equals the
number stored in the memory.
The automatic reset circuit generates a signal which resets all
flip-flops of the scaler and of the main counter to the "0" state,
when either fuze power or setter power is applied to the timer.
If the fuze power supply is on, the fuze oscillator feeds pulses
through gates G.sub.1 and G.sub.2 into the scaler. The signal from
the a.sup.8 output is transmitted through gates G.sub.3 and G.sub.4
to the input of the main counter. On the other hand, the positive
voltage from the fuze power supply prevents any other signal from
passing through gate G.sub.5. Thus, the scaler and the main counter
work in series, as required for in-flight timing operation. For
checking and setting operations, that is with the fuze power off,
the scaler and the main counter can be cycled individually at the
pulse rate of the fuze oscillator. The input signal is provided by
the output of gate G.sub.6. Gate G.sub.6 is controlled by the
setter over the control line. G.sub.6 puts out fuze oscillator
pulses regardless of the state of the control line, if there is a
low output signal from G.sub.9. Whether the output pulses from
G.sub.6 are fed into the main counter or the scaler is determined
by the state of the 2.sup.9 flip-flop of the scaler. If this
flip-flop is in the "0" state, the pulses are fed into the scaler
and if it is in the "1" state, the pulses are fed into the main
counter. Besides setter power and ground, there are two signal
lines, memory reset and feedback lines and memory set and control
line, required from the setter to the fuze. Each of these two
signal lines is shared by two different signals. The feedback
signal and the control signal are at a high potential in the "0" or
"no signal" state. If they go low, it is interpreted as a "1" or a
signal. The memory reset or memory set signal have an amplitude
which is more positive than the "0" state of the signal with which
they share the line. The circuits which separate the two signals
are incorporated in the programmable decoder. The feedback signal
is so composed that the information it supplies to the setter is
sufficient for a decision about the operation condition and the
setting of the timer. The feedback signal from the scaler is
generated in gates G.sub.10 and G.sub.11. In order to get a low
output signal from gate G.sub.11, it is necessary that the 2.sup.9
flip-flop in the scaler is in the "0" state. This means that the
output of G.sub.6 is connected to the input of the scaler. As long
as the 2.sup.8 flip-flop of the scaler is in the "0" state, the
output signal of G.sub.10 consists of inverted clock pulses. When
the 2.sup.8 flip-flop of the scaler switches to the "1" state, the
output of G.sub.10 goes high and stays high as long as the 2.sup.8
flip-flop remains in the "1" state. When all flip-flops are reset
to the "0" state, there will be an output signal consisting of fuze
oscillator pulses G.sub.11. If the control line is actuated, gate
G.sub.8 goes high, G.sub.6 puts out pulses, which are counted in
the scaler. When 256 pulses have been counted by the scaler, the
2.sup.8 flip-flop switches to the "1" state. The output signal of
G.sub.11 stays low until 512 pulses have occurred and the 2.sup.8
flip-flop switches back to the "0" state. At the same time, the
2.sup.9 flip-flop changes to the low state and gate G.sub.11
prevents further output signals.
The feedback signal from the main counter is generated in gates
G.sub.12 and G.sub.13. In order to obtain a low output signal at
G.sub.13, it is necessary that there is a low output signal from
the decoder. When the timer is shipped from the manufacturer, all
memory elements are set to the "1" state (memory transistor not
conducting) and therefore corresponds to the maximum time
capability of the counter. If the timer had been set previously,
the number stored in the memory will be between 2.5 seconds
(minimum time setting allowed by setter) and the maximum time. The
memory will always contain at least one "1." Therefore, there will
be no low output signal from the decoder prior to a memory reset
pulse if the main counter has been reset to 0. This prevents a low
output signal at gate G.sub.13. After a memory reset pulse, the
output of the decoder goes low and G.sub.13 puts out pulses. The
memory reset pulse also switches the 2.sup.9 flip-flop of the
scaler to the "1" state, which prevents oscillator pulses from
G.sub.11 and connects the output of G.sub.6 to the input of the
main counter. If the control line is now actuated, the control line
input to G.sub.8 goes high, the main counter starts counting. At a
count of 1024, the 2.sup.10 flip-flop switches to the "1" state.
Since the 2.sup.11 flip-flop is still in the "0" state, the output
of gate G.sub.9 goes negative and G.sub.8 is now latched
independent of the control line and counting continues. Also, the
output of G.sub.13 stays low as long as the 2.sup.10 flip-flop
remains in the "1" state. The memory is still reset and its output
is low. When the 2.sup.10 flip-flop switches back to the "0" state,
the output of G.sub.9 goes high and the output of G.sub.13 changes
back to oscillator pulses. If the main counter is cycled once more,
there will be only feedback pulses throughout the cycle, since the
2.sup.11 flip-flop is now in the "1" state.
If a number had been inserted into the memory and the main counter
is reset to 0, there is no low output signal from the decoder. This
prevents a feedback signal from the main counter. If the 2.sup.9
flip-flop of the scaler is in the "1" state, there will be no
feedback signal at the output of G.sub.14. With the control line
actuated and the main counter counting, the first feedback signal
will occur, when the state of the main counter matches the state of
memory.
The setting and checking procedure is described as follows. As
mentioned previously, four connecting wires between fuze and setter
are required to set the timer. After these connections are made,
setter power is applied to the timer. This generates an automatic
reset. After a short delay to allow the fuze oscillator to
stabilize, a memory reset pulse is applied to the memory reset and
feedback line as shown at 78 in FIG. 5. This resets all memory
elements to the "0" (on) state and the 2.sup.9 flip-flop of the
scaler is set to the "1" state.
The next step is a check of the main counter. After the memory
elements have been reset to 0, the setter receives oscillator
pulses as feedback signals through gates G.sub.12, G.sub.13, and
G.sub.14. These pulses indicate that the oscillator is working and
that a low output signal from the decoder is present. This also
indicates that the memory has been reset. The pulses will allow the
setter to operate G.sub.6 in the correct phase relationship with
the fuze oscillator. If no pulses are received by the setter within
a certain short time, or if the feedback signal stays low
continuously, an error signal is displayed and the sequence is
stopped. If the feedback signal is correct, the control line is
actuated, goes low, the input to G.sub.8 goes high, with the first
negative going edge of the feedback signal. This allows the main
counter to count. The output of G.sub.9 is high, because of its
reset state oscillator pulses reach the counter through G.sub.6,
G.sub.5, and G.sub.4. At the same time, the setter counts the
feedback pulses in parallel to the main counter via gates 12, 13,
and 14. When the feedback signal changes from individual pulses to
a constant low level, this is detected in the setter. If this
change occurs at a count other than 1024, an error signal is
generated and the sequence stops. If the change occurs at a count
of 1024, it indicates that the main counter had been reset and that
it is counting correctly. At 1024, the output of G.sub.9 goes low
and G.sub.12 high. The output of the output circuit is still low
and G.sub.14 goes high. Further, the number 1024 verifies that the
feedback signal received by the setter was generated by the main
counter and not from the scaler due to some error. The control line
and the counter in the setter are reset after a slight delay after
the count of 1024. Since the 2.sup.10 flip-flop is in the "1" state
and the 2.sup.11 flip-flop is in the "0" state, the output of
G.sub.9 is low. Thus, G.sub.8 provides a high input signal into
G.sub.6 which maintains the count operation of the main counter
until all flip-flops 2.sup.0 through 2.sup.10 are in the "0" state
and the 2.sup.11 flip-flop is in the "1" state. Then the output of
G.sub.8 goes low and stops oscillator pulses into the counter. The
feedback line was low between 1024 and 2048 because G.sub.9 was
low. During the next phase, the desired time setting is inserted
into the main counter. The waveforms are shown in FIG. 6. The
waveforms in FIG. 6 overlap with the waveforms in FIG. 5. The
broken line at 80 in FIG. 6 indicates the moment when the 2.sup.10
flip-flop switches back to the "0" state. Before the 2048 fall time
appeared, gate 12 was high due to the low input from G.sub.9. When
the 2048 fall time appears, G.sub.9 goes high but simultaneously
the clock signal goes low and G.sub.12 stays high until one-half a
clock pulse later. The scaler and counter are both assumed to
switch on the negative going edge of the clock pulses. With the
first low going edge of the feedback signal, the control line goes
low. This allows the main counter to count starting from 0. While
the main counter is counting pulses from the fuze oscillator, the
counter in the setter is counting pulses from the precision
oscillator. When the counter in the setter reaches the state that
represents the desired time, the control line goes high. Since the
2.sup.11 flip-flop is in the "1" state, it cannot maintain fuze
oscillator pulses to the main counter. The count stops when the
control line goes high, regardless of the state of the 2.sup.11
flip-flop is in the "1" state, it cannot maintain fuze oscillator
pulses to the main counter. The count stops when the control line
goes high, regardless of the state of the 2.sup.10 flip-flop. Now a
memory set pulse is applied to the memory set and control line.
This duplicates the state of the main counter in the memory. This
completes the setting sequence. Power to the fuze can now be turned
off.
The time interval during which the main counter was counting was
determined by the precision oscillator and the counter in the
setter. The main counter receives the number of pulses from the
fuze oscillator that corresponds to the desired time setting
regardless, within limits, of the fuze oscillator frequency. The
start of the count interval was synchronized with the beginning of
a fuze oscillator period. The counter in the setter has to count at
a higher rate than the main counter to make the start error small.
The stop of the count interval can occur anywhere within a period
of the fuze oscillator. Under the assumption that the duty cycle of
the fuze oscillator is 50 percent and that the main counter steps
with the trailing edge of the clock pulse, a round off effect takes
place. If the stop occurs during the first half of a cycle (low
half cycle), the main counter remains on the last count. Should the
stop take place during the positive half cycle of the clock, one
count is added when the input signal is cut off, as shown at 82 in
FIG. 6. If the start error of the counter in the setter can be
neglected, the maximum setting error is half a period of the fuze
oscillator. In use, the maximum error would be one-half a period of
the output of the scaler.
The setting sequence is automatically followed by a check sequence,
but a selector switch on the setting box will also allow a run
through of the checking sequence alone.
The first step is a scaler check. The waveforms for this are shown
in FIG. 7. When setter power is turned on, an automatic reset is
generated. Gates G.sub.10 and G.sub.11 generate a feedback signal
consisting of oscillator pulses. G.sub.13 is blocked since no
output from the decoder is present. G.sub.6 is blocked by G.sub.8
which is blocked by the control line. After a short delay, the
control line is actuated with a trailing edge of the feedback
signal. Before the control line is activated (goes low), the setter
tests for feedback oscillator pulses. If no low feedback signal is
received by the setter within a certain time interval or if the
feedback signal stays low constantly, an error signal is generated.
The low signal on the control line enables the scaler to count. At
the same time, the counter in the setter counts feedback pulses. At
a count of 256, the feedback signal goes low and stays low because
the 2.sup.8 flip-flop of the scaler is in the "1" state and
G.sub.11 and G.sub.14 are activated. This change is detected by the
setter. If it occurs at a count different from 256, an error signal
is generated. A count of 256 indicates that the scaler had been
reset and that it is working properly. It also verifies that the
feedback signal was generated by the scaler.
In the next step, the setting of the timer is checked. The
waveforms for the timer check are shown in FIG. 8. The control line
is still low and the scaler is counting. Also, the feedback signal
is still low because the 2.sup.11 flip-flop of the scaler is in the
"1" state. While the setter is waiting for the feedback signal to
return to its "0" state, the counter in the setter is reset to 0.
When the 2.sup.8 flip-flop of the scaler switches from the "1"
state to the "0" state, the 2.sup.9 flip-flop of the scaler
switches from the "0" state to the "1" state at count 512. This
blocks G.sub.11 and no further feedback from the scaler occurs. At
the same time, the count operation of the scaler is stopped by
blocking G.sub.7 and the main counter starts counting because
G.sub.5 is now conducting. The scaler state is now all "0" except
the 2.sup.9 flip-flop. When the feedback signal goes high, the
counter in the setter starts counting pulses from the precision
oscillator until its state represents the selected time. The
feedback signal stays high until the number in the main counter
equals the number stored in the memory. Then a low output signal
from the decoder occurs and the feedback line goes low and feeds
back oscillator pulses. This resets the control line. The time
interval between coincidence of the setter counter with the
selected time and the occurrence of a feedback signal or between
feedback and coincidence, depending on the sequence of events, is
measured in the setter. If this time interval exceeds 0.7 periods
of the fuze oscillator at its standard frequency, an error signal
is generated. If the time interval is within tolerance, a ready
signal is displayed. Power is turned off and the fuze is ready for
firing. It is assumed that the tolerance counter counts at 10 times
the frequency of the fuze oscillator. The tolerance of 0.7 standard
periods of fuze oscillator or seven counts of the tolerance counter
allows an error of five counts in the main counter, one count for
frequency variation of the fuze oscillator and one count start
error of the setter counter.
When the control line goes high, the main counter is stopped if the
time setting is smaller than 1024 counts. For a time setting of
1024 counts or longer, the main counter will continue to count as
shown with dashed lines at 84 in FIG. 8 until the main counter
reaches 2048 or setter power to the fuze is removed. But this has
no effect on the operation of the setter since the first trailing
edge of the feedback signal performs the switching.
The timing operation is described as follows: When the round is
fired, spin and setback activate the fuze power supply. This
results in an automatic reset signal. With fuze power on, G.sub.1
is conducting, G.sub.5 is not. The scaler starts counting. After
256 pulses, the 2.sup.8 flip-flop of the scaler switches to the "1"
state. Since G.sub.3 is conducting, the main counter receives a
positive signal. At a count of 512, the 2.sup.8 flip-flop of the
scaler switches back to the "0" state. This results in a negative
step at the input of the main counter which advances the main
counter by one step. This repeats every 512 pulses. The positive
potential of the fuze power supply blocks G.sub.5 and prevents
oscillator pulses from getting to the main counter. If G.sub.7
should transmit clock pulses, it does not affect the operation of
the scaler, since the outputs of G.sub.1 and G.sub.7 are in phase.
When the number represented by the state of the main counter equals
the number stored in the memory, a low output signal from the
decoder occurs, which triggers the firing circuit.
Resetting of the memory occurs as follows: Referring to FIG. 4,
when power is applied to the decoder, diode D.sub.1 clamps the
substrate S.sub.1 and the source of transistors Q.sub.1 through
Q.sub.11, Q.sub.F and Q.sub.34 to +25 v. If there is no feedback
signal, the gate of Q.sub.F is closed to ground and Q.sub.F is
conducting. Therefore, the memory reset and feedback line is at
approximately +25 v, which represents the "0" or "no signal"
state.
Source and gate of Q.sub.34 are at approximately the same
potential. Therefore Q.sub.34 is turned off and its drain and the
gates of all resistors on S.sub.1 are at ground potential. The
resistors are conducting. Also Q.sub.S located on substrate S.sub.3
is turned on. Q.sub.S clamps substrate S.sub.2 and the source of
all transistors located on it to approximately +25 v. The memory
set and control line is in the "0" or "no signal" state, that is,
at +25 v. Q.sub.36 is turned off and the control line input to gate
G.sub.8 (FIG. 1) is close to ground. Q.sub.35 is turned off.
Therefore, all resistors on S.sub.2 are conducting.
The drain of transistor Q.sub.F and the source of resistor R.sub.F
are P-regions diffused into the N-substrate. Therefore, they
represent diodes with their cathode connected to S.sub.1. If a
positive memory reset pulse in excess of +25 v. is applied to the
memory reset and feedback line, these diodes become forward biased.
The potential of substrate S.sub.1 rises to about the amplitude of
the memory reset pulse. Since the source of transistors Q.sub.1
through Q.sub.11 is connected to S.sub.1, all these transistors are
turned on regardless of the state of the counter and clamp the
gates of the memory transistors Q.sub.12 through Q.sub.22 to the
amplitude of the memory reset pulse. When the potential of S.sub.1
rises, Q.sub.34 turns on. This turns off all resistors on S.sub.1
to prevent excessive current and also turns off transistor Q.sub.S.
Therefore, substrate S.sub.2 is at ground potential. Thus, the
memory transistors Q.sub.12 through Q.sub.22 experience the full
amplitude of the memory reset pulse between gate and substrate.
Therefore, they are all switched to the "on" state, which
represents "0".
When setting the memory, after the desired setting has been
inserted into the main counter, a positive memory set pulse in
excess of +25 v. is applied to the memory set and control line.
Diode D.sub.3 clamps the source of Q.sub.S to about the amplitude
of the memory set pulse. Since the gate of Q.sub.S is at ground,
substrate S.sub.2 is clamped to the potential of the memory set
pulse. Q.sub.35 is turned on. This turns off all resistors on
S.sub.2 except R.sub.24 to prevent excessive current.
Depending on the state of the corresponding counter flip-flops,
transistors Q.sub.1 through Q.sub.11 are turned on or turned off.
As an example, let us consider stage 2.sup.0. If the 2.sup.0
flip-flop is in the "0" state, Q.sub.1 is on. The gate of Q.sub.12
is therefore at +25 v. The voltage between gate of Q.sub.12 and
substrate is the difference between the amplitude of the memory set
pulse and +25 v. This voltage is not sufficient to switch the state
of Q.sub.12 and it remains in the "on" state. If the 2.sup.0
flip-flop is in the "1" state, Q.sub.1 is off. The gate of Q.sub.12
is close to ground and Q.sub.12 experiences almost the full
amplitude of the memory set pulse between gate and substrate. This
switches Q.sub.12 from the "on" state to the "off" state. The same
is true for all remaining stages. Hence it follows that all memory
transistors whose corresponding flip-flops are in the "1" state are
switched to the "off" state, which represents a "1." The rest
remain unchanged in the "on" or "0" state. Thus, the state of the
main counter is duplicated in the memory.
For readout, power is applied to the timer. The main counter is
reset to 0. All N-substrates and the source of the transistors
located on them are at approximately +25 v.
If the main counter counts up, the following combinations occur in
the 2.sup.0 state:
State Memory Q.sub.12 State of State of State of of 2.sup.0 FF set
to Q.sub.1 Q.sub.12 Q.sub.23
__________________________________________________________________________
0 0 on on on off 1 0 on off on off 0 1 off on off on 1 1 off off on
off
__________________________________________________________________________
From the above table it follows that Q.sub.23 is turned off if the
number in the 2.sup.0 stage of the counter is greater than or equal
to the number stored in the memory transistor Q.sub.12. This is
true for each bit. In order to obtain a low going output signal
from the decoder, as required by the logic of FIG. 1, all
transistors Q.sub.23 through Q.sub.33 have to be off. This means
that the number represented by the state of the counter is equal to
or greater than the number stored in the memory. Since the main
counter is counting up from 0, the first low output signal occurs
when the number in the counter equals the number stored in the
memory. As the counter continues counting, the negative output
signal may disappear. This is caused by the simplified design of
the comparator. It only compares the individual bits without
assigning a weight to them. Therefore, the output signal may
disappear although the number in the counter is greater than the
number in the memory if a low order "1" in the counter changes to
"0" and a "1" is stored in the corresponding memory element. But
since the timer only uses the first output signal, which represents
an equality, the shape of the output signal after that is
immaterial.
For isolation, the individual MNOS devices have to have a source to
drain breakdown voltage which is higher than the switching voltage
of the memories.
All MNOS devices with the exclusion of the memory transistors
Q.sub.12 through Q.sub.22 have to perform like MOS devices. This
means that they have to be in the "off" state. Therefore, the
circuit is so designed that non of them experiences a high enough
positive voltage between gate and substrate to change it to the
"on" state. A negative voltage which tends to turn the device off
does not affect its performance.
Both signal lines from the setter are shared by two different
signals. These signals have to be separated as they enter the
decoder circuit.
The memory reset and feedback line is at +25 v. in its quiescent
state. The signal more positive than +25 v. generates a memory
reset signal. The output of the feedback gate G.sub.14 connects to
the gate of transistor Q.sub.F and is therefore not affected by the
memory reset pulse. If there is a feedback signal, gate G.sub.14
puts out a signal that goes from ground to +25 v. This turns off
transistor Q.sub.F . Therefore, the memory reset and feedback line
receives a signal that goes from +25 v. to ground, as shown.
The memory set and control line is at +25 v. in the "0" or "no
signal" state. A positive signal in excess of +25 v. generates a
memory set pulse. Transistor Q.sub.36 is off during that time.
Therefore, the input to gate G.sub.8 remains close to ground, which
keeps gate G.sub.6 blocked. If the control line is actuated, a
signal is applied that goes from +25 v. to ground. This turns on
Q.sub.36 and the input signal to gate G.sub.8 goes positive, as
required to initiate a count operation.
Diode D.sub.4 can be omitted if the signal for setting the 2.sup.9
flip-flop in the scaler feeds directly into the gate of a MOS
transistor without any protective device between gate and
substrate.
The potential of the gates of the memory transistors Q.sub.12
through Q.sub.22 is determined by the voltage drop across D.sub.1
and across the corresponding transistor on substrate S.sub.1. The
source potential of the memory transistors is determined by the
voltage drop across D.sub.2 and Q.sub.S. Since Q.sub.S has to carry
a higher current than any one of the transistors Q.sub.1 through
Q.sub.11, this may result in a positive bias of the memory
transistors. This may be avoided by adding two discrete diodes as
shown at 88 in FIG. 4 by dashed lines.
It is apparent from the above that the present invention provides
an improved and simplified, inexpensive timer particularly adapted
for operation in artillery projectile fuzes. Important features of
the invention include the incorporation of MNOS devices in the
decoder which act as memories without power and which may be formed
by conventional integrated circuit techniques in a manner similar
to the MOS transistors making up the scaler and main counter.
Because of the integrated circuit fabrication of the components,
the timer may be of very small size and weight. The unit is
completely resettable, and may be reset from a remote source and
the system automatically adjusts the setting for deviations of the
oscillator frequency from its nominal value.
* * * * *